Dr. Subrahmanya K N holds a Ph.D. in Electrical Engineering from the Indian Institute of Technology Kanpur, with research expertise in optical imaging, signal processing, and machine learning for nanoscale metrology. His doctoral work focused on developing advanced computational approaches in diffraction phase microscopy and digital holography, with applications in high-resolution, non-invasive surface profiling.

He is a gold medalist in M.Tech.

With more than a decade of combined experience in academia and industry, he previously served as an Assistant Professor at RV College of Engineering and Gogte Institute of Technology. In these roles, he not only taught a wide range of undergraduate and postgraduate courses but also mentored numerous student projects, guided thesis work, and successfully executed consultancy assignments in applied engineering domains.

Dr. Subrahmanya’s research has resulted in several peer-reviewed publications in leading journals such as Optics and Laser Technology, Applied Optics, and Optics and Lasers in Engineering. His contributions include advancing deep learning-based fringe analysis techniques for robust optical metrology, bridging computational intelligence with experimental optics. In recognition of his expertise, he actively serves as a reviewer for reputed international journals including Optics and Laser Technology, Optik, and others.

• Theory of Computation
• Signal Processing
• Applied Numerical Methods
• Introduction to Photonics
• Communication Systems

• Applied machine and deep learning
• Optimization techniques
• Phase retrieval methods
• High performance techniques

• Subrahmanya Keremane Narayan and Rajshekhar Gannavarpu, Precision surface metrology using rapid optimization method in diffraction phase microscopy, Applied Optics.
• Subrahmanya Keremane Narayan and Rajshekhar Gannavarpu, Simultaneous estimation of multiple order phase derivatives using deep learning method in digital holographic interferometry, Optics and Lasers in Engineering, 184 (1), 108583, 2025.
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• Subrahmanya Keremane Narayan, Dhruvam Pandey, Allaparthi Venkata Satya Vithin, and Rajshekhar Gannavarpu, Robust method to process nonuniform intensity holograms in digital holographic microscopy for nanoscale surface metrology, Applied Optics, 62 (32), 8497-8505, 2023.
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• Subrahmanya Keremane Narayan, Allaparthi Venkata Satya Vithin, Sreeprasad Ajithaprasad and Rajshekhar Gannavarpu, Surface profile measurement using nonlinear optimization approach in diffraction phase microscopy, Optics and Laser Technology, 167, 109723, 2023
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• Subrahmanya Keremane Narayan, Allaparthi Venkata Satya Vithin, and Rajshekhar Gannavarpu, Deep learning assisted non-contact defect identification method using diffraction phase microscopy, Applied Optics, 62 (20), 5433-5442, 2023
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• Subrahmanya Keremane Narayan, Viren S Ram, and Rajshekhar Gannavarpu, “Temporal defect identification using deep learning method in digital holographic interferometry”, Proc. SPIE 13567, Optical Measurement Systems for Industrial Inspection XIV, 135672B, SPIE Optical Metrology, Munich, Germany, 2025
• Subrahmanya Keremane Narayan, Dhruvam Pandey and Rajshekhar Gannavarpu, “Non- destructive Surface Defect Metrology using Deep Learning and Diffraction Phase Microscopy”. Optica Imaging Congress, Toulouse, France, CTh4B.7, 2024.
• Subrahmanya Keremane Narayan, Dhruvam Pandey and Rajshekhar Gannavarpu, “Complex wave retrieval method for nanometric surface metrology”, International Conference on Experimental Mechanics (ICEM 2024), Chennai, 2024
• Subrahmanya Keremane Narayan, Allaparthi Venkata Satya Vithin, and Rajshekhar Gannavarpu, “Non-contact topography using quadratic optimization approach in diffraction phase microscopy”, Frontiers in Optics, Washington, USA, FD1.5, 2023
• Subrahmanya Keremane Narayan, Viren S Ram, and Rajshekhar Gannavarpu, “Conditional generative modelling based fringe pattern normalization”, Optica Imaging Congress, Digital Holography and Three-Dimensional Imaging, Boston, USA, JWA2A.25, 2023
• Dhruvam Pandey, K N Subrahmanya and Rajshekhar Gannavarpu, “Nanoscale surface topography using low cost digital holographic microscopy”, Proceedings SPIE 12618, Optical Measurement Systems for Industrial Inspection XIII, 126180Z, Munich, Germany, 2023
• Ajay Kumar GC, KN Subrahmanya, Sajeesh Ammikkallingal, Sai Anudeep Polisetti, Physical Design, Power and Area Optimization of High Frequency Block at Smaller Technology Node, 2019 4th International Conference on Recent Trends on Electronics, Information, Communication & Technology (RTEICT)

• Executed consultancy project on “Reliability Testing of RPi” in association with TE Connectivity,Pune.
• Mentored a project titled Enhancement of automobile fuel efficiency using microcontrollers sponsored by Dept. of IT and BT, Govt. of Karnataka funded with Rs. 3Lac, which eventually culminated in a student patent.
• Completed a project titled Multiple-Input Multiple-Output (MIMO) Radar: Detection of slow moving targets. It was an initial successful implementation of radar application to simulate a practical channel characterized by Weibull-distributed clutter, focusing on slow-moving targets.